Direct detection of charged particles with SiPMs

نویسندگان

چکیده

The direct response of Silicon PhotoMultipliers being traversed by a MIP charged particle have been studied in systematic way for the first time. Using beam test data, time resolution and crosstalk probability measured. A characterization SiPM means laser is also reported. results obtained different sensors indicate measured around 40-70 ps. Although particles are expected to traverse only one SPAD per event, measurements on an unexpected higher value with respect related sensor noise.

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ژورنال

عنوان ژورنال: Journal of Instrumentation

سال: 2022

ISSN: ['1748-0221']

DOI: https://doi.org/10.1088/1748-0221/17/06/p06007